Laboratory for High-Frequency Engineering

Pro­vi­si­on, op­ti­miza­t­i­on and de­ve­lop­ment of me­thods and sys­tems of high-fre­quen­cy en­gi­nee­ring. They are used from the small-si­gnal ran­ge for dia­gnostic ap­p­li­ca­ti­ons to the lar­ge-si­gnal ran­ge for the ope­ra­ti­on of mi­cro­wa­ve plas­ma sour­ces. 
The fo­cus is cur­rent­ly on the fol­lo­wing sys­tems:

• (fre­quen­cy-re­sol­ved) mi­cro­wa­ve in­ter­fe­ro­me­try power con­trol­led and in free ra­dia­ting sys­tems up to 150 GHz
  • Elec­tron den­si­ty de­ter­mi­na­ti­on: 10¹² – 10²² m^-3, 
    ∆t < 1 µs
  • De­ter­mi­na­ti­on of per­mit­ti­vi­ty und per­me­a­bi­li­ty
• De­ve­lop­ment and im­ple­men­ta­ti­on of beam-shaping ele­ments (mir­rors and len­ses) for the ad­just­ment of Gaus­si­an beam paths up to 150 GHz
• fre­quen­cy-re­sol­ved re­flec­to­metry in power con­trol­led and in free ra­dia­ting sys­tems up to 50 GHz
  • Sin­gle-port in­ter­fe­ro­me­try for the elec­tron den­si­ty de­ter­mi­na­ti­on
• Ad­just­ment and op­ti­miza­t­i­on of me­thods of the di­gi­tal si­gnal pro­ces­sing
• De­ve­lop­ment of mi­cro­wa­ve com­po­n­ents for the ma­ni­pu­la­ti­on of scat­te­ring pa­ra­me­ters
  • Pha­se shif­ter
  • Matching net­works
  • Mo­de cou­pler
  • Bar­ri­er-free re­ac­tor ac­cess ports
• De­ve­lop­ment of mi­cro­wa­ve plas­ma sour­ces
  • Mi­ni-MIP (powers < 100 W)
  • Plexc (powers < 1500 W)

The de­ve­lop­ment ac­tivi­ties in the lis­ted fiel­ds of ac­tivi­ty are sup­por­ted by nu­me­ri­cal tools such as Mat­lab^©, Com­sol Mul­ti­phy­sics^© und CST Mi­cro­wa­ve Stu­dio^©. The re­sults ob­tai­ned with it can be va­li­da­ted by me­ans of sys­tems for net­work ana­ly­sis with a mea­su­ring ran­ge up to 50 GHz.